LD Microprecision designs, manufactures, and markets a wide range of test probes (both cantilever & blade) commonly use in the die-sort and wafer mapping process. Our specially designed equipments and proprietary processes enable us to produce ultra fine probes with tight tolerance specification to ensure effective and long lasting applications. Tips radius down to six(6) microns can be maintained.
- Tungsten Rhenium (WR)
- Tungsten (W)
- Beryllium Copper (BeCu)
- Paliney 7 (P7)
- 0.20mm (8mils)
- 0.25mm (10mils)
- 0.50mm (20mils)
|Product Code||Material||Probe Diameter||Taper Length||Tip Configuration||Length||Part Number|
|TP||WR||10 mils||2.65||Flat||2 inch||TPWR10-2.65-F0.5-2.0|
|TP||W||20 mils||2.65||Radius||1.25 inch||TPW20-2.65-R0.2-1.25|
|TP||BC||8 mils||2.65||Flat||2 inch||TPBC08-2.65-F0.4-2.0|
* For sizes not found above, we can custom made to meet customer requirements.